This course describes the main microscopy and spectroscopy methods allowing to characterize the morphology, structure and physical properties of nanostructures and nanomaterials. It is divided in three parts, corresponding to three distinct groups of imaging techniques:
1) optical microscopies (including confocal, fluorescence and superresolution approaches).
2) scanning and transmission electron microscopies.
3) scanning probe microscopies (scanning tunnelling microscopy, atomic force microscopy and scanning near field optical microscopy will be covered).
In each case, the key features of the considered techniques (working principle, resolution, contrast, compatible samples…) will be discussed, and examples of their use originating from various fields of nanoscience, nanotechnology and biology will be presented. Practicals will address atomic force and scanning electron microscopies.
